Measure the Invisible to Provide Deep Process Insight： Nova offers a comprehensive suite of materials and dimensional metrology combined with advanced modeling that enables semiconductor manufacturers to gain deeper insight throughout the entire manufacturing process, increase yields, and shorten time to market. Translate Metrology Data into Concise Insight： Nova offers in-line optical integrated and stand-alone metrology platforms. The metrology product portfolio, combined with our modeling algorithm software, delivers unique measurement capabilities for the most advanced semiconductor technology nodes. In-Line Materials Metrology for Semiconductor Manufacturing： Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs. Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield. Nova’s product portfolio also includes powerful offline data management solutions, advanced algorithms for data analysis and server utilities for complete fleet management. Pursuing Insights to Simplify Complex Problems： Nova’s suite of software modeling products is comprised of NovaMARS model-based and NovaFit machine learning modeling solutions, which are supported by the Nova HPC (High Power Computing) platform. Our comprehensive software modeling portfolio provides customers with a complete modeling and application development solution designed for complex 3D and HAR structures in the most advanced logic and memory technology nodes.